Hiwave Ultrasonic Non-destructive Testing System
# S300
Details:
High performance AIO system.
Increased scanning speed & scanning accelerated velocity, and scanning time is accelerated to 35s/piece; With full profile welded frame and active balance damping system, S300 can efficiently decrease the equipment body shudder caused by high scanning accelerated velocity, and improve the image quality.
Used for rapid complete detection on small and medium-sized parts or samples in workshop or physical/ chemical laboratories.
Characteristic:
High speed, fulfill complete inspection requirement.
Applications:
Semiconductor, IC (Integrated Circuits), Diamond tools industries.
Specification:
1. Rated Control Circuit Voltage (Uc): 220V/50Hz, 3KW
2. Maximum Scanning Range: 500mm×330mm×100mm
3. Overall Size: 1250mm×850mm×1300mm
(Standard configuration)
4. Transducer Frequency: 1~50MHz
(Standard configuration; Can be upgraded up to 230MHz)
5. Recommended Image Resolution Ratio: 0.5um ~ 4000um;
6. Typical Scanning Time: ≤35s
(Operation condition: 10mm × 10mm, Image resolution ratio: 50um)
7. Maximum Scanning Speed: 1000 mm/s
Maximum Scanning Accelerated Velocity: 8 m/s²
8. Motion Mechanism Positional Accuracy:
Axis X and Y: ±0.5um Axis Z: ±10um
Resetting Positional Accuracy:
Axis X and Y: ≤±0.01mm Axis Z: ≤±0.02mm
9. Sampling Frequency: 25~250MHz;
(Standard configuration; Can be upgraded up to 1.5GHz)
10. Adjustable Increment of each Channel: -13~66dB
(Standard configuration; Can be upgraded)
Pulse Repetition Frequency: 5kHz
(Standard configuration; Can be upgraded)